Search results for "Image contrast"

showing 4 items of 4 documents

Camera-based measurement of relative image contrast in projection displays

2013

International audience; This research investigated the measured contrast of projection displays based on pictures taken by un-calibrated digital cameras under typical viewing conditions. A high-end radiometer was employed as a reference to the physical response of projection luminance. Checkerboard, gray scale and color complex test images with a range of the projector's brightness and contrast settings were projected. Two local and two global contrast metrics were evaluated on the acquired pictures. We used contrast surface plots and Pearson correlation to investigate the measured contrast versus the projector's brightness and contrast settings. The results suggested, as expected, the proj…

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image Processingoptical projectors[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processingprojection luminanceComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processingmeasured contrastradiometersImage color analysismetrics[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processingstatistical analysispicture acquisitioncamerasgray scaleBrightnessoptical variables measurementdigital cameracamera-based measurementRadiometry[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processingdisplay devicesDigital camerasuncalibrated digital cameraglobal contrast metricsprojector brightness settingscheckerboardcolor complex test imagesrelative image contrastviewing conditionsradiometerimage processingCorrelationPearson correlationhigh-end radiometerprojection displayprojector contrast settings[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingprojection displayscontrast surface plotsstatistic based metrics
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Inspection of EUVL mask blank defects and patterned masks using EUV photoemission electron microscopy

2008

We report on recent developments of an "at-wavelength" full-field imaging technique for inspection of multilayer mask blank defects and patterned mask samples for extreme ultraviolet lithography (EUVL) by EUV photoemission electron microscopy (EUV-PEEM). A bump-type line defect with a width of approximately 35nm that is buried beneath Mo/Si multilayer has been detected clearly, and first inspection results obtained from a patterned TaN absorber EUVL mask sample is reported. Different image contrast of a similar width of multilayer-covered substrate line defect and on top TaN absorber square has been observed in the EUV-PEEM images, and origin of the difference in their EUV-PEEM image contra…

Materials sciencebusiness.industryExtreme ultraviolet lithographySubstrate (electronics)Condensed Matter PhysicsBlankAtomic and Molecular Physics and OpticsImage contrastSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopyOpticslawOptoelectronicsElectrical and Electronic EngineeringPhotolithographyElectron microscopebusinessLine (formation)Microelectronic Engineering
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Monolithic focused reference beam x-ray holography

2013

Fourier transform holography is a highly efficient and robust imaging method, suitable for single-shot imaging at coherent X-ray sources. In its common implementation, the image contrast is limited by the reference signal generated by a small pinhole aperture. Increased pinhole diameters improve the signal, whereas the resolution is diminished. Here we report a new concept to decouple the spatial resolution from the image contrast by employing a Fresnel zone plate to provide the reference beam. Superimposed on-axis images of distinct foci are separated with a novel algorithm. Our method is insensitive to mechanical drift or vibrations and allows for long integration times common at low-flux…

PhysicsMultidisciplinarybusiness.industryHolographyX-rayGeneral Physics and AstronomyGeneral ChemistryZone plateBioinformaticsGeneral Biochemistry Genetics and Molecular BiologyImage contrastArticlelaw.inventionsymbols.namesakeFourier transformOpticslawReference beamsymbolsddc:530businessImage resolution
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Divisive normalization image quality metric revisited.

2010

Structural similarity metrics and information-theory-based metrics have been proposed as completely different alternatives to the traditional metrics based on error visibility and human vision models. Three basic criticisms were raised against the traditional error visibility approach: (1) it is based on near-threshold performance, (2) its geometric meaning may be limited, and (3) stationary pooling strategies may not be statistically justified. These criticisms and the good performance of structural and information-theory-based metrics have popularized the idea of their superiority over the error visibility approach. In this work we experimentally or analytically show that the above critic…

Computer sciencebusiness.industryImage qualityMachine visionPoolingNormalization (image processing)Wavelet transformImage processingImage enhancementMachine learningcomputer.software_genreAtomic and Molecular Physics and OpticsImage contrastElectronic Optical and Magnetic MaterialsOpticsComputer Vision and Pattern RecognitionArtificial intelligencebusinesscomputerJournal of the Optical Society of America. A, Optics, image science, and vision
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